ProfileOfResearchers

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682

TÃTULO: Up conversion from visible to ultraviolet in bulk ZnO implanted with Tm ions Full Text
AUTORES: Monteiro, T ; Neves, AJ ; Soares, MJ ; Carmo, MC; Peres, M; Alves, E ; Rita, E;
PUBLICAÇÃO: 2005, FONTE: APPLIED PHYSICS LETTERS, VOLUME: 87, NÚMERO: 19

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683

TÃTULO: XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(001) substrates Full Text
AUTORES: Franco, N; Barradas, NP ; Alves, E ; Vallera, AM; Morris, RJH; Mironov, OA; Parker, EHC;
PUBLICAÇÃO: 2005, FONTE: Symposium on Materials Science and Device Issues for Future Si-Based Technologies held at the 2005 EMRS Meeting in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 124, NÚMERO: SUPPL.

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684

TÃTULO: Amorphisation of GaN during processing with rare earth ion beams Full Text
AUTORES: Lorenz, K ; Wahl, U ; Alves, E ; Wojtowicz, T; Ruterana, P; Ruffenach, S; Briot, O;
PUBLICAÇÃO: 2004, FONTE: Meeting of the European-Materials-Research-Society in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 36, NÚMERO: 4-6

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685

TÃTULO: Atomic environment and interfacial structural order of TiAlN/Mo multilayers Full Text
AUTORES: Tavares, CJ ; Rebouta, L ; Riviere, JP; Girardeau, T; Goudeau, P; Alves, E ; Barradas, NP ;
PUBLICAÇÃO: 2004, FONTE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 187, NÚMERO: 2-3

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686

TÃTULO: Characterisation of defects in rare earth implanted GaN by deep level transient spectroscopy Full Text
AUTORES: Colder, A; Marie, P; Wojtowicz, T; Ruterana, P; Eimer, S; Mechin, L; Lorenz, K ; Wahl, U ; Alves, E ; Matias, V; Mamor, M;
PUBLICAÇÃO: 2004, FONTE: Meeting of the European-Materials-Research-Society in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 36, NÚMERO: 4-6

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687

TÃTULO: Characterization of FePt nanoparticles in FePt/C multilayers Full Text
AUTORES: Barradas, NP ; Alves, E ; Babonneau, D;
PUBLICAÇÃO: 2004, FONTE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, NÚMERO: 1-4

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688

TÃTULO: Characterization of hard DC-sputtered Si-based TiN coatings: the effect of composition and ion bombardment Full Text
AUTORES: Ribeiro, E; Rebouta, L ; Carvalho, S ; Vaz, F ; Fuentes, GG; Rodriguez, R; Zazpe, M; Alves, E ; Goudeau, P; Riviere, JP;
PUBLICAÇÃO: 2004, FONTE: 31st International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 188, NÚMERO: 1-3 SPEC.ISS.

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689

TÃTULO: Comparative study of radiation damage in GaN and InGaN by 400 keV Au implantation Full Text
AUTORES: Wendler, E; Wesch, W; Alves, E ; Kamarou, A;
PUBLICAÇÃO: 2004, FONTE: 12th International Conference on Radiation Effects in Insulators in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 218, NÚMERO: 1-4

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690

TÃTULO: Compositional profiles in silica-based sol-gel films doped with erbium and silver, by RBS and ERDA Full Text
AUTORES: Marques, AC ; Almeida, RM ; Ramos, AR ; Alves, E ;
PUBLICAÇÃO: 2004, FONTE: 12th International Workshop on Sol-Gel-Science and Technology (Sol-Gel 2003) in JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, VOLUME: 31, NÚMERO: 1-3

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