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722

TÃTULO: Structural and corrosion behaviour of stoichiometric and substoichiometric TiN thin films Full Text
AUTORES: Rocha, LA ; Ariza, E ; Ferreira, J; Vaz, E ; Ribeiro, E; Rebouta, L ; Alves, E ; Ramos, AR ; Goudeau, P; Riviere, JP;
PUBLICAÇÃO: 2004, FONTE: Symposium on Protective Coatings and Thin Films held at the E-MRS 20th Spring Meeting in SURFACE & COATINGS TECHNOLOGY, VOLUME: 180

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723

TÃTULO: Structural, optical and mechanical properties of coloured TiNxOy thin films Full Text
AUTORES: Vaz, F ; Cerqueira, P; Rebouta, L ; Nascimento, SMC ; Alves, E ; Goudeau, P; Riviere, JR; Pischow, K; de Rijk, J;
PUBLICAÇÃO: 2004, FONTE: 30th International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 447

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724

TÃTULO: Study of silica-titania films doped with Er and Ag by RBS and ERDA Full Text
AUTORES: Marques, AC ; Ramos, AR ; Alves, E ; Almeida, RM ;
PUBLICAÇÃO: 2004, FONTE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, NÚMERO: 1-4

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725

TÃTULO: The effect of temperature on the structure of iron-implanted sapphire Full Text
AUTORES: McHargue, CJ; Ononye, LC; Alves, E ; Marques, C; Allard, LF;
PUBLICAÇÃO: 2004, FONTE: 12th International Conference on Radiation Effects in Insulators in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 218, NÚMERO: 1-4

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726

TÃTULO: The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
AUTORES: Stepikhova, MV; Cerqueira, MF ; Losurdo, M; Giangregorio, MM; Alves, E ; Monteiro, T ; Soares, MJ ;
PUBLICAÇÃO: 2004, FONTE: Conference Dedicated to Oleg Vladimirovich Losev (1903-1942) - Pioneer of Semiconductor Electronics in PHYSICS OF THE SOLID STATE, VOLUME: 46, NÚMERO: 1

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727

TÃTULO: Annealing behavior and lattice site location of Er implanted InGaN Full Text
AUTORES: Alves, E ; Wahl, U ; Correia, MR ; Pereira, S ; De Vries, B; Vantomme, A;
PUBLICAÇÃO: 2003, FONTE: 13th International Conference on Ion Beam Modification of Materials in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 206

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728

TÃTULO: Dielectric function of nanocrystalline silicon with few nanometers (< 3 nm) grain size Full Text
AUTORES: Losurdo, M; Giangregorio, MM; Capezzuto, P; Bruno, G; Cerqueira, MF ; Alves, E ; Stepikhova, M;
PUBLICAÇÃO: 2003, FONTE: APPLIED PHYSICS LETTERS, VOLUME: 82, NÚMERO: 18

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729

TÃTULO: Effects of the morphology and structure on the elastic behavior of (Ti,Si,Al)N nanocomposites Full Text
AUTORES: Carvalho, S ; Ribeiro, E; Rebouta, L ; Vaz, F ; Alves, E ; Schneider, D; Cavaleiro, A ;
PUBLICAÇÃO: 2003, FONTE: 8th International Conference on Plasma Surface Engineering in SURFACE & COATINGS TECHNOLOGY, VOLUME: 174

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CrossRef: 18

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730

TÃTULO: Electron micro-probe analysis and cathodoluminescence spectroscopy of rare earth implanted GaN
AUTORES: Dalmasso, S; Martin, RW; Edwards, PR; Katchkanov, V; O'Donnell, KP; Lorenz, K ; Alves, E ; Wahl, U ; Pipeleers, B; Matias, V; Vantomme, A; Nakanishi, Y; Wakahara, A; Yoshida, A;
PUBLICAÇÃO: 2003, FONTE: Symposium on GaN and Related Alloys held at the MRS Fall Meeting in GAN AND RELATED ALLOYS - 2003, VOLUME: 798

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