ProfileOfResearchers

722

TÃTULO: RBS analysis of AlGaSb thin films Full Text
AUTORES: Barradas, NP ; Alves, E ; Ruiz, CM; Dieguez, E; Dimroth, F; Chenot, MA; Bett, A;
PUBLICAÇÃO: 2004, FONTE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, NÚMERO: 1-4

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723

TÃTULO: Recent emission channeling studies in wide band gap semiconductors Full Text
AUTORES: Wahl, U ; Correia, JG ; Rita, E; Alves, E ; Soares, JC ; De Vries, B; Matias, V; Vantomme, A;
PUBLICAÇÃO: 2004, FONTE: Joint Meeting of the 13th International Conference on Hyperfine Interactions/17th International Symposium on Nuclear Quadrupole Interactions (HFI/NQI 2004) in HYPERFINE INTERACTIONS, VOLUME: 159, NÚMERO: 1-4

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724

TÃTULO: Roughness in GaN/InGaN films and multilayers determined with Rutherford backscattering Full Text
AUTORES: Barradas, NP ; Alves, E ; Pereira, S ; Shvartsman, VV; Kholkin, AL ; Pereira, E; O'Donnell, KP; Liu, C; Deatcher, CJ; Watson, IM; Mayer, M;
PUBLICAÇÃO: 2004, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 217, NÚMERO: 3

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725

TÃTULO: Stability and optical activity of Er implanted MgO Full Text
AUTORES: Pinto, JV ; da Silva, RC; Alves, E ; Soares, MJ ; Monteiro, T ; Gonzalez, R;
PUBLICAÇÃO: 2004, FONTE: 12th International Conference on Radiation Effects in Insulators in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 218, NÚMERO: 1-4

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726

TÃTULO: Structural and corrosion behaviour of stoichiometric and substoichiometric TiN thin films Full Text
AUTORES: Rocha, LA ; Ariza, E ; Ferreira, J; Vaz, E ; Ribeiro, E; Rebouta, L ; Alves, E ; Ramos, AR ; Goudeau, P; Riviere, JP;
PUBLICAÇÃO: 2004, FONTE: Symposium on Protective Coatings and Thin Films held at the E-MRS 20th Spring Meeting in SURFACE & COATINGS TECHNOLOGY, VOLUME: 180

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727

TÃTULO: Structural, optical and mechanical properties of coloured TiNxOy thin films Full Text
AUTORES: Vaz, F ; Cerqueira, P; Rebouta, L ; Nascimento, SMC ; Alves, E ; Goudeau, P; Riviere, JR; Pischow, K; de Rijk, J;
PUBLICAÇÃO: 2004, FONTE: 30th International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 447

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728

TÃTULO: Study of silica-titania films doped with Er and Ag by RBS and ERDA Full Text
AUTORES: Marques, AC ; Ramos, AR ; Alves, E ; Almeida, RM ;
PUBLICAÇÃO: 2004, FONTE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, NÚMERO: 1-4

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729

TÃTULO: The effect of temperature on the structure of iron-implanted sapphire Full Text
AUTORES: McHargue, CJ; Ononye, LC; Alves, E ; Marques, C; Allard, LF;
PUBLICAÇÃO: 2004, FONTE: 12th International Conference on Radiation Effects in Insulators in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 218, NÚMERO: 1-4

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730

TÃTULO: The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
AUTORES: Stepikhova, MV; Cerqueira, MF ; Losurdo, M; Giangregorio, MM; Alves, E ; Monteiro, T ; Soares, MJ ;
PUBLICAÇÃO: 2004, FONTE: Conference Dedicated to Oleg Vladimirovich Losev (1903-1942) - Pioneer of Semiconductor Electronics in PHYSICS OF THE SOLID STATE, VOLUME: 46, NÚMERO: 1

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