ProfileOfResearchers

NO MEU:

ORCID |

842

TÃTULO: Molecular H-2 and H-3 energy loss measurements along the Si < 111 > direction Full Text
AUTORES: Behar, M; Grande, PL; Azevedo, GD; Alves, E ; da Silva, MF; Soares, JC ;
PUBLICAÇÃO: 2000, FONTE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161

INDEXADO EM:

Scopus

WOS

NO MEU:

ORCID |

843

TÃTULO: RBS/channeling study of Er doped GaN films grown by MBE on Si(111) substrates Full Text
AUTORES: Lorenz, K ; Vianden, R; Birkhahn, R; Steckl, AJ; da Silva, MF; Soares, JC; Alves, E ;
PUBLICAÇÃO: 2000, FONTE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161

INDEXADO EM:

Scopus

WOS

NO MEU:

ORCID |

844

TÃTULO: Structural and magnetic studies of Fe-implanted alpha-Al2O3 Full Text
AUTORES: Alves, E ; MacHargue, C; Silva, RC; Jesus, C; Conde, O ; de Silva, MF; Soares, JC ;
PUBLICAÇÃO: 2000, FONTE: 11th International Conference on Surface Modification of Metals by Ion Beams (SMMIB-99) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 128, NÚMERO: 1

INDEXADO EM:

Scopus

WOS

NO MEU:

ORCID |

845

TÃTULO: Structure determination of (Ti,Al)N/Mo multilayers Full Text
AUTORES: Tavares, CJ ; Rebouta, L ; Alves, EJ ;
PUBLICAÇÃO: 2000, FONTE: 11th International Conference on Thin Films (ICTF-11) in THIN SOLID FILMS, VOLUME: 373, NÚMERO: 1-2

INDEXADO EM:

Scopus

WOS

NO MEU:

ORCID |

846

TÃTULO: Surface studies of SiC/SiCf composites exposed to relevant fusion reactor conditions Full Text
AUTORES: Alves, LC ; Paul, A; Alves, E ; da Silva, MF; Soares, JC; Rebouta, L ; La Barbera, A; Riccordi, B; Centeno, MA; Odriozola, JA;
PUBLICAÇÃO: 2000, FONTE: 8th European Conference on Applications of Surface and Interface Analysis in SURFACE AND INTERFACE ANALYSIS, VOLUME: 30, NÚMERO: 1

INDEXADO EM:

Scopus

WOS

NO MEU:

ResearcherID

847

TÃTULO: Annealing behavior and lattice site location of Hf implanted GaN Full Text
AUTORES: Alves, E ; da Silva, MF; Marques, JG ; Soares, JC ; Freitag, K;
PUBLICAÇÃO: 1999, FONTE: Proceedings of the 1998 Symposium L: on Nitrides and Related Wide Band Gap Materials (E-MRS Meeting) in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 59, NÚMERO: 1-3

INDEXADO EM:

Scopus

WOS

NO MEU:

ORCID |

848

TÃTULO: Characterisation of YBaCuO-PrBaCuO multilayers grown by pulsed injection MO-CVD Full Text
AUTORES: Galindo, V; Senateur, JP; Alves, E ; da Silva, RC; Silva, JA ; Cruz, MM ; Godinho, M ; Casaca, A ; Grégoire Bonfait ;
PUBLICAÇÃO: 1999, FONTE: International Conference on Physics and Chemistry of Molecular and Oxide Superconductors (MOS-99) in JOURNAL OF LOW TEMPERATURE PHYSICS, VOLUME: 117, NÚMERO: 3-4

INDEXADO EM:

Scopus

WOS

NO MEU:

ORCID |

849

TÃTULO: Effect of crystal orientation on damage accumulation and post-implantation annealing for iron implantation into sapphire Full Text
AUTORES: McHargue, CJ; Alves, E ; da Silva, MF; Soares, JC;
PUBLICAÇÃO: 1999, FONTE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, NÚMERO: 1-4

INDEXADO EM:

Scopus

WOS

NO MEU:

ORCID |

850

TÃTULO: Electrical conductivity in ion implanted TiO2-single crystals
AUTORES: Fromknecht, R; Khubeis, I; Massing, S; Meyer, O; da Silva, RC; Alves, E ;
PUBLICAÇÃO: 1999, FONTE: Proceedings of the 1998 International Conference on 'Ion Implantation Technology' Proceedings (IIT'98) in Proceedings of the International Conference on Ion Implantation Technology, VOLUME: 2

INDEXADO EM:

Scopus

NO MEU:

ORCID |