Fernando Manuel Duarte Gonçalves


AuthID: R-000-51G

Confirmed Publications: 34



31
TITLE: IC defects-based testability analysis
AUTHORS: Sousa, JJT; Goncalves, FM ; Teixeira, JP ;
PUBLISHED: 1992, SOURCE: Proceedings of the International Test Conference 1991 in Digest of Papers - International Test Conference
INDEXED IN: Scopus
IN MY: ORCID
32
TITLE: Layout-level techniques for testability improvement of MOS physical designs
AUTHORS: Santos, MB ; Goncalves, FM ; Sousa, JJT; Teixeira, JP ;
PUBLISHED: 1992, SOURCE: Proceedings of the 6th Mediterranean Electrotechnical Conference - Melecon '91 in 6th Mediterranean Electrotechnical Conference
INDEXED IN: Scopus
IN MY: ORCID
33
TITLE: A methodology for testability enhancement at layout level
AUTHORS: Teixeira, JP ; Teixeira, IC ; Almeida, CFB; Goncalves, FM ; Goncalves, J;
PUBLISHED: 1991, SOURCE: Journal of Electronic Testing, VOLUME: 1, ISSUE: 4
INDEXED IN: Scopus CrossRef
IN MY: ORCID
34
TITLE: PHYSICAL DESIGN OF TESTABLE CMOS DIGITAL INTEGRATED-CIRCUITS
AUTHORS: DESOUSA, JJHT; GONCALVES, FM ; TEIXEIRA, JP ;
PUBLISHED: 1991, SOURCE: European Solid-State Circuits Conference 1990 - ESSCIRC '90 in IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOLUME: 26, ISSUE: 7
INDEXED IN: Scopus WOS
IN MY: ORCID
Página 4 de 4. Total de resultados: 34.

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