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TÍTULO: Impedance frequency characterization of a vibrating wire viscosity sensor with multiharmonic signals  Full Text
AUTORES: Jose Santos; Fernando M Janeiro ; Pedro M Ramos ;
PUBLICAÇÃO: 2014, FONTE: MEASUREMENT, VOLUME: 55
INDEXADO EM: Scopus WOS CrossRef
32
TÍTULO: Impedance frequency response measurements with multiharmonic stimulus and estimation algorithms in embedded systems  Full Text
AUTORES: Jose Santos; Fernando M Janeiro ; Pedro M Ramos ;
PUBLICAÇÃO: 2014, FONTE: MEASUREMENT, VOLUME: 48, NÚMERO: 1
INDEXADO EM: Scopus WOS CrossRef
33
TÍTULO: Measurement Time Optimization of Impedance Spectroscopy Techniques Applied to a Vibrating Wire Viscosity Sensor
AUTORES: Santos, J; Janeiro, FM ; Ramos, PM;
PUBLICAÇÃO: 2014, FONTE: 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
INDEXADO EM: Scopus
34
TÍTULO: RFID Chip Characterization through S-Parameter Measurements and Gene Expression Programming  Full Text
AUTORES: Fernando M Janeiro ; Carlos A Fernandes ; Jorge R. Costa ; Pedro M Ramos ;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
INDEXADO EM: Scopus WOS CrossRef: 1
35
TÍTULO: Ultra high frequency circuit identification through gene expression programming
AUTORES: Janeiro, FM ; Jorge R. Costa ; Fernandes, CA ; Ramos, PM;
PUBLICAÇÃO: 2014, FONTE: 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
INDEXADO EM: Scopus
36
TÍTULO: Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks
AUTORES: Rosado, LS; Janeiro, FM ; Ramos, PM ; Piedade, M ;
PUBLICAÇÃO: 2013, FONTE: 29th Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, NÚMERO: 5
INDEXADO EM: Scopus WOS CrossRef Handle
37
TÍTULO: Gene expression programming for automatic circuit model identification in impedance spectroscopy: Performance evaluation  Full Text
AUTORES: Pedro M Ramos ; Fernando M Janeiro ;
PUBLICAÇÃO: 2013, FONTE: IMEKO World Congress in MEASUREMENT, VOLUME: 46, NÚMERO: 10
INDEXADO EM: Scopus WOS CrossRef
38
TÍTULO: Gene Expression Programming in Sensor Characterization: Numerical Results and Experimental Validation
AUTORES: Fernando M Janeiro ; Jose Santos; Pedro M Ramos ;
PUBLICAÇÃO: 2013, FONTE: 29th Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, NÚMERO: 5
INDEXADO EM: Scopus WOS CrossRef
39
TÍTULO: Improving the convergence of gene expression programming in impedance spectroscopy
AUTORES: Ramos, PM; Janeiro, FM ;
PUBLICAÇÃO: 2013, FONTE: 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing in 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
INDEXADO EM: Scopus
40
TÍTULO: Threshold estimation in least-squares error functions: Application to impedance spectroscopy
AUTORES: Janeiro, FM ; Ramos, PM;
PUBLICAÇÃO: 2013, FONTE: 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing in 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
INDEXADO EM: Scopus
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