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TÍTULO: Performance comparison between complex non-linear least squares and genetic algorithms in impedance circuit parameter estimation
AUTORES: Janeiro, FM ; Ramos, PM;
PUBLICAÇÃO: 2015, FONTE: 21st IMEKO World Congress on Measurement in Research and Industry in XXI IMEKO World Congress "Measurement in Research and Industry"
INDEXADO EM: Scopus
32
TÍTULO: Advances in cloud base height and wind speed measurement through stereophotogrammetry with low cost consumer cameras  Full Text
AUTORES: Fernando M Janeiro ; Filipe Carretas; Konrad Kandler; Frank Wagner; Pedro M Ramos ;
PUBLICAÇÃO: 2014, FONTE: 20th World Congress of the International-Measurement-Confederation (IMEKO) - Metrology for Green Growth in MEASUREMENT, VOLUME: 51, NÚMERO: 1
INDEXADO EM: Scopus WOS CrossRef
33
TÍTULO: Embedded Viscosity Measurement System using a Vibrating-Wire Sensor  Full Text
AUTORES: Jose Santos; Fernando M Janeiro ; Pedro M Ramos ;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
INDEXADO EM: Scopus WOS CrossRef
34
TÍTULO: Impedance frequency characterization of a vibrating wire viscosity sensor with multiharmonic signals  Full Text
AUTORES: Jose Santos; Fernando M Janeiro ; Pedro M Ramos ;
PUBLICAÇÃO: 2014, FONTE: MEASUREMENT, VOLUME: 55
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: Impedance frequency response measurements with multiharmonic stimulus and estimation algorithms in embedded systems  Full Text
AUTORES: Jose Santos; Fernando M Janeiro ; Pedro M Ramos ;
PUBLICAÇÃO: 2014, FONTE: MEASUREMENT, VOLUME: 48, NÚMERO: 1
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: Measurement Time Optimization of Impedance Spectroscopy Techniques Applied to a Vibrating Wire Viscosity Sensor
AUTORES: Santos, J; Janeiro, FM ; Ramos, PM;
PUBLICAÇÃO: 2014, FONTE: 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
INDEXADO EM: Scopus
37
TÍTULO: RFID Chip Characterization through S-Parameter Measurements and Gene Expression Programming  Full Text
AUTORES: Fernando M Janeiro ; Carlos A Fernandes ; Jorge R. Costa ; Pedro M Ramos ;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
INDEXADO EM: Scopus WOS CrossRef: 1
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TÍTULO: Ultra high frequency circuit identification through gene expression programming
AUTORES: Janeiro, FM ; Jorge R. Costa ; Fernandes, CA ; Ramos, PM;
PUBLICAÇÃO: 2014, FONTE: 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
INDEXADO EM: Scopus
39
TÍTULO: Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks
AUTORES: Rosado, LS; Janeiro, FM ; Ramos, PM ; Piedade, M ;
PUBLICAÇÃO: 2013, FONTE: 29th Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, NÚMERO: 5
INDEXADO EM: Scopus WOS CrossRef Handle
40
TÍTULO: Gene expression programming for automatic circuit model identification in impedance spectroscopy: Performance evaluation  Full Text
AUTORES: Pedro M Ramos ; Fernando M Janeiro ;
PUBLICAÇÃO: 2013, FONTE: IMEKO World Congress in MEASUREMENT, VOLUME: 46, NÚMERO: 10
INDEXADO EM: Scopus WOS CrossRef
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