João Paulo Cacho Teixeira


AuthID: R-000-7A4

Confirmed Publications: 110



21
TITLE: Built-in Clock Domain Crossing (CDC) test and diagnosis in GALS systems
AUTHORS: Leong, C; Machado, P; Bexiga, V; Teixeira, JP ; Teixeira, IC ; Silva, JC; Lousa, P; Varela, J ;
PUBLISHED: 2010, SOURCE: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010 in Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010
INDEXED IN: Scopus CrossRef
IN MY: ORCID
22
TITLE: Delay modeling for power noise-aware design in Spartan-3A FPGAS
AUTHORS: Freijedo, JF; Valdes, MD; Moure, MJ; Costas, L; Rodriguez Andina, JJ; Jorge Semião ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: 6th Southern Programmable Logic Conference, SPL 2010 in 6th Southern Programmable Logic Conference, SPL 2010 - Proceedings
INDEXED IN: Scopus CrossRef
IN MY: ORCID
23
TITLE: Impact of power supply voltage variations on FPGA-based digital systems performance
AUTHORS: Freijedo, J; Costas, L; Jorge Semião ; Rodriguez Andina, JJ; Moure, MJ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: Journal of Low Power Electronics, VOLUME: 6, ISSUE: 2
INDEXED IN: Scopus CrossRef
IN MY: ORCID
24
TITLE: Low-sensitivity to process variations aging sensor for automotive safety-critical applications
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: 28th IEEE VLSI Test Symposium, VTS10 in Proceedings of the IEEE VLSI Test Symposium
INDEXED IN: Scopus CrossRef
IN MY: ORCID
25
TITLE: Predictive error detection by on-line aging monitoring
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: 16th IEEE International On-Line Testing Symposium, IOLTS 2010 in Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010
INDEXED IN: Scopus CrossRef
IN MY: ORCID
26
TITLE: Programmable aging sensor for automotive safety-critical applications
AUTHORS: Vazquez, JC; Champac, V; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: Design, Automation and Test in Europe Conference and Exhibition, DATE 2010 in Proceedings -Design, Automation and Test in Europe, DATE
INDEXED IN: Scopus
IN MY: ORCID
27
TITLE: An Overview of the Clear-PEM Breast Imaging Scanner
AUTHORS: Albuquerque, E; Almeida, FG ; Almeida, P ; Auffray, E; Barbosa, J; Bastos, AL; Bexiga, V; Bugalho, R; Carmona, S; Carrico, B; Ferreira, CS; Ferreira, NC; Ferreira, M; Frade, M; Godinho, J; Goncalves, F ; Guerreiro, C; Lecoq, P; Leong, C; Lousa, P; Machado, P; Martins, MV ; Matela, N ; Moura, R; Neves, P; Oliveira, N; Ortigao, C ; Piedade, F; Pinheiro, JF; Relvas, P; Rivetti, A; Rodrigues, P; Rolo, I; Sampaio, J; Santos, AI; Santos, J; Silva, MM ; Tavernier, S; Teixeira, IC; Teixeira, JP ; Silva, R; Silva, JC; Trindade, A; Varela, J ; ...More
PUBLISHED: 2009, SOURCE: IEEE Nuclear Science Symposium/Medical Imaging Conference in 2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9
INDEXED IN: Scopus WOS CrossRef
28
TITLE: Built-In Aging Monitoring for Safety-Critical Applications  Full Text
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
29
TITLE: Characterization of the Clear-PEM Breast Imaging Scanner Performance
AUTHORS: Albuquerque, E; Almeida, FG ; Almeida, P ; Auffray, E; Barbosa, J; Bastos, AL; Bexiga, V; Bugalho, R; Cardoso, C; Carmona, S; Carneiro, JF ; Carrico, B; Ferreira, CS; Ferreira, NC; Ferreira, M; Frade, M; Goncalves, F ; Guerreiro, C; Lecoq, P; Leong, C; Lousa, P; Machado, P; Martins, MV; Matela, N ; Moura, R; Neves, J; Neves, P; Oliveira, N; Ortigao, C ; Piedade, F; Pinheiro, JF; Relvas, P; Rivetti, A; Rodrigues, P; Rolo, I; Santos, AI; Santos, J; Silva, MM ; Tavernier, S; Teixeira, IC ; Teixeira, JP ; Silva, JC; Silva, R; Trindade, A; Varela, J ; Bento, P; ...More
PUBLISHED: 2009, SOURCE: IEEE Nuclear Science Symposium Conference 2009 in 2009 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-5
INDEXED IN: Scopus WOS CrossRef: 5
IN MY: ORCID
30
TITLE: Controllability and Observability in Mixed Signal Cores  Full Text
AUTHORS: Jose Rocha; Nuno Dias; Angelo Monteiro; Alexandre Neves; Gabriel Santos; Marcelino Santos ; Teixeira, JP ;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
Página 3 de 11. Total de resultados: 110.

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