José Alberto Peixoto Machado da Silva


AuthID: R-000-7Z3

Confirmed Publications: 85



61
TITLE: Functional in-circuit characterisation of Sigma Delta modulators  Full Text
AUTHORS: da Silva, JM ; Duarte, JS; Matos, JS ;
PUBLISHED: 2002, SOURCE: 6th Euro Workshop on ADC Modelling and Testing (EWADC in MEASUREMENT, VOLUME: 32, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
62
TITLE: A method for the in-circuit testing of σδ modulators
AUTHORS: Da Silva, JM ; Duarte, JS; Matos, JS;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXED IN: Scopus
IN MY: ORCID
63
TITLE: ADC testing using joint time-frequency analysis  Full Text
AUTHORS: Mendonca, H ; da Silva, JM ; Matos, JS ;
PUBLISHED: 2001, SOURCE: COMPUTER STANDARDS & INTERFACES, VOLUME: 23, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
64
TITLE: Differential gain and phase testing using joint time-frequency analysis
AUTHORS: Mendonca, HS ; Silva, JM ; Matos, JS;
PUBLISHED: 2001, SOURCE: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) in IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS, VOLUME: 3
INDEXED IN: Scopus WOS
IN MY: ORCID
65
TITLE: DYNAD: a Framework IVSMT project addressed to the development of dynamic test techniques for analog-to-digital converters  Full Text
AUTHORS: Morandi, C; Chiorboli, G; Dallet, D; Haddadi, D; Mazzoleni, S; da Silva, JM ; Pernull, H; Roy, PY;
PUBLISHED: 2000, SOURCE: COMPUTER STANDARDS & INTERFACES, VOLUME: 22, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef: 4
IN MY: ORCID
66
TITLE: Mixed-signal BIST using correlation and reconfigurable hardware
AUTHORS: Machado Da Silva, J ; Duarte, JS; Matos, JS ;
PUBLISHED: 2000, SOURCE: Design, Automation and Test in Europe Conference and Exhibition 2000, DATE 2000 in Proceedings -Design, Automation and Test in Europe, DATE
INDEXED IN: Scopus CrossRef
IN MY: ORCID
67
TITLE: ADC testing using joint time-frequency analysis
AUTHORS: Mendonca, HS ; Silva, JM ; Matos, JS ;
PUBLISHED: 1999, SOURCE: 3rd International Conference on Advanced A/D and D/A Conversion Techniques and their Applications in THIRD INTERNATIONAL CONFERENCE ON ADVANCED A/D AND D/A CONVERSION TECHNIQUES AND THEIR APPLICATIONS, ISSUE: 466
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
68
TITLE: Mixed-signal board level DfT techniques using IEEE P1149.4
AUTHORS: Matos Jose, S; da Silva Jose Machado ;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 2
INDEXED IN: Scopus
IN MY: ORCID
69
TITLE: Using IEEE P1149.4
AUTHORS: J.S Matos; Machado da Silva, J ;
PUBLISHED: 1998, SOURCE: 1998 IEEE International Conference on Electronics, Circuits and Systems. Surfing the Waves of Science and Technology (Cat. No.98EX196)
INDEXED IN: CrossRef
IN MY: ORCID
70
TITLE: Implementation and evaluation of mixed current / voltage testing using the IEEE P1149.4 infrastructure
AUTHORS: Da Silva, JM ; Alves, JC ; Matos, JS ;
PUBLISHED: 1997, SOURCE: IEE Colloquium (Digest), ISSUE: 361
INDEXED IN: Scopus CrossRef
IN MY: ORCID
Página 7 de 9. Total de resultados: 85.

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