Maria Beatriz Alves Sousa Santos
AuthID: R-000-AMX
51
TÃTULO: Test preparation methodology for high covemge of physical defects in CMOS digital ICs
AUTORES: Santos, MB; Simges, M; Teixeira, I; Teixeira, JP;
PUBLICAÇÃO: 1995, FONTE: 1995 European Conference on Design and Test, EDTC 1995 in Proceedings of the 1995 European Conference on Design and Test, EDTC 1995
AUTORES: Santos, MB; Simges, M; Teixeira, I; Teixeira, JP;
PUBLICAÇÃO: 1995, FONTE: 1995 European Conference on Design and Test, EDTC 1995 in Proceedings of the 1995 European Conference on Design and Test, EDTC 1995
INDEXADO EM: 
Scopus
Scopus