11
TÍTULO: Low pass digital filter delay compensation for accurate zero cross detection in power quality
AUTORES: Rodrigues, NM; Janeiro, FM ; Ramos, PM;
PUBLICAÇÃO: 2017, FONTE: 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements in 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements, VOLUME: 2017-September
INDEXADO EM: Scopus
12
TÍTULO: Analysis of Business Processes with Enterprise Ontology and Process Mining
AUTORES: Artur Caetano; Pedro Pinto; Carlos Mendes; Miguel Mira da Silva ; Jose Borbinha;
PUBLICAÇÃO: 2015, FONTE: 5th Enterprise Engineering Working Conference (EEWC) in ADVANCES IN ENTERPRISE ENGINEERING IX, VOLUME: 211
INDEXADO EM: Scopus WOS CrossRef
13
TÍTULO: Performance comparison between complex non-linear least squares and genetic algorithms in impedance circuit parameter estimation
AUTORES: Janeiro, FM ; Ramos, PM;
PUBLICAÇÃO: 2015, FONTE: 21st IMEKO World Congress on Measurement in Research and Industry in XXI IMEKO World Congress "Measurement in Research and Industry"
INDEXADO EM: Scopus
14
TÍTULO: Comparison of spin valve and magnetic tunnel junction magneto resistive sensors in eddy current testing probes
AUTORES: Rosado, LS; Cardoso, FA; Cardoso, S ; Santos, TG ; Ramos, PM; Freitas, PP; Piedade, M;
PUBLICAÇÃO: 2015, FONTE: 21st IMEKO World Congress on Measurement in Research and Industry in XXI IMEKO World Congress "Measurement in Research and Industry"
INDEXADO EM: Scopus
15
TÍTULO: Using Event Logs and the psi-theory to Analyse Business Processes
AUTORES: Pedro Linares Pinto; Carlos Mendes; Miguel Mira da Silva ; Artur Caetano;
PUBLICAÇÃO: 2015, FONTE: 30th ACM Symposium on Applied Computing (SAC) in 30TH ANNUAL ACM SYMPOSIUM ON APPLIED COMPUTING, VOLS I AND II, VOLUME: 13-17-April-2015
INDEXADO EM: Scopus WOS CrossRef
16
TÍTULO: Ultra high frequency circuit identification through gene expression programming
AUTORES: Janeiro, FM ; Jorge R. Costa ; Fernandes, CA ; Ramos, PM;
PUBLICAÇÃO: 2014, FONTE: 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
INDEXADO EM: Scopus
17
TÍTULO: Reaching python from racket
AUTORES: Ramos, PP; Leitao, AM ;
PUBLICAÇÃO: 2014, FONTE: 8th International Lisp Conference, ILC 2014 in ACM International Conference Proceeding Series
INDEXADO EM: Scopus CrossRef: 1
18
TÍTULO: Improving the convergence of gene expression programming in impedance spectroscopy
AUTORES: Ramos, PM; Janeiro, FM ;
PUBLICAÇÃO: 2013, FONTE: 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing in 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
INDEXADO EM: Scopus
19
TÍTULO: Threshold estimation in least-squares error functions: Application to impedance spectroscopy
AUTORES: Janeiro, FM ; Ramos, PM;
PUBLICAÇÃO: 2013, FONTE: 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing in 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
INDEXADO EM: Scopus
20
TÍTULO: Trends and challenges in lead free soldering
AUTORES: Dias Lopes, EM; Pinto, M; Assuncao, E; Coutinho, L;
PUBLICAÇÃO: 2012, FONTE: 2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2012 in 2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2012
INDEXADO EM: Scopus CrossRef
Página 2 de 4. Total de resultados: 39.