Pedro Miguel Pinto Ramos
AuthID: R-000-F0Z
51
TÃTULO: Magnetic tunnel junction based eddy current testing probe for detection of surface defects Full Text
AUTORES: Cardoso, FA; Rosado, L; Ferreira, R; Paz, E; Cardoso, S; Ramos, PM; Piedade, M; Freitas, PP;
PUBLICAÇÃO: 2014, FONTE: JOURNAL OF APPLIED PHYSICS, VOLUME: 115, NÚMERO: 17
AUTORES: Cardoso, FA; Rosado, L; Ferreira, R; Paz, E; Cardoso, S; Ramos, PM; Piedade, M; Freitas, PP;
PUBLICAÇÃO: 2014, FONTE: JOURNAL OF APPLIED PHYSICS, VOLUME: 115, NÚMERO: 17
52
TÃTULO: Impedance frequency characterization of a vibrating wire viscosity sensor with multiharmonic signals Full Text
AUTORES: Jose Santos; Fernando M Janeiro; Pedro M Ramos;
PUBLICAÇÃO: 2014, FONTE: MEASUREMENT, VOLUME: 55
AUTORES: Jose Santos; Fernando M Janeiro; Pedro M Ramos;
PUBLICAÇÃO: 2014, FONTE: MEASUREMENT, VOLUME: 55
53
TÃTULO: RFID Chip Characterization through S-Parameter Measurements and Gene Expression Programming Full Text
AUTORES: Fernando M Janeiro; Carlos A Fernandes ; Jorge R. Costa ; Pedro M Ramos;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
AUTORES: Fernando M Janeiro; Carlos A Fernandes ; Jorge R. Costa ; Pedro M Ramos;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
54
TÃTULO: Ultra high frequency circuit identification through gene expression programming
AUTORES: Janeiro, FM; Jorge R. Costa ; Fernandes, CA ; Ramos, PM;
PUBLICAÇÃO: 2014, FONTE: 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
AUTORES: Janeiro, FM; Jorge R. Costa ; Fernandes, CA ; Ramos, PM;
PUBLICAÇÃO: 2014, FONTE: 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
INDEXADO EM: 
Scopus
Scopus55
TÃTULO: Embedded Measurement System for Non-Destructive Testing using New Eddy Currents Planar Array Probe
AUTORES: Abrantes, R; Ramos, PM; Rosado, LS; Piedade, M;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
AUTORES: Abrantes, R; Ramos, PM; Rosado, LS; Piedade, M;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
56
TÃTULO: Embedded Viscosity Measurement System using a Vibrating-Wire Sensor Full Text
AUTORES: Jose Santos; Fernando M Janeiro; Pedro M Ramos;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
AUTORES: Jose Santos; Fernando M Janeiro; Pedro M Ramos;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
57
TÃTULO: Portable Instrument for Eddy Currents Non-Destructive Testing based on Heterodyning Techniques
AUTORES: Aguiam, DE; Ramos, PM; Rosado, LS; Piedade, M;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
AUTORES: Aguiam, DE; Ramos, PM; Rosado, LS; Piedade, M;
PUBLICAÇÃO: 2014, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
58
TÃTULO: Improved Magnetic Tunnel Junctions Design for the Detection of Superficial Defects by Eddy Currents Testing
AUTORES: Filipe A Cardoso; Luis S Rosado; Fernando Franco; Ricardo Ferreira; Elvira Paz; Susana F Cardoso; Pedro M Ramos; Moises Piedade; Paulo J P Freitas;
PUBLICAÇÃO: 2014, FONTE: IEEE TRANSACTIONS ON MAGNETICS, VOLUME: 50, NÚMERO: 11
AUTORES: Filipe A Cardoso; Luis S Rosado; Fernando Franco; Ricardo Ferreira; Elvira Paz; Susana F Cardoso; Pedro M Ramos; Moises Piedade; Paulo J P Freitas;
PUBLICAÇÃO: 2014, FONTE: IEEE TRANSACTIONS ON MAGNETICS, VOLUME: 50, NÚMERO: 11
59
TÃTULO: Reaching python from racket
AUTORES: Ramos, PP; Leitao, AM ;
PUBLICAÇÃO: 2014, FONTE: 8th International Lisp Conference, ILC 2014 in ACM International Conference Proceeding Series
AUTORES: Ramos, PP; Leitao, AM ;
PUBLICAÇÃO: 2014, FONTE: 8th International Lisp Conference, ILC 2014 in ACM International Conference Proceeding Series
60
TÃTULO: Intelligent composting assisted by a wireless sensing network
AUTORES: Lopez, M; Martinez Farre, X; Casas, O; Quilez, M; Polo, J; Lopez, O; Hornero, G; Pinilla, MR; Rovira, C; Ramos, PM; Borges, B; Marques, H; Girao, PS;
PUBLICAÇÃO: 2014, FONTE: Waste Management, VOLUME: 34, NÚMERO: 4
AUTORES: Lopez, M; Martinez Farre, X; Casas, O; Quilez, M; Polo, J; Lopez, O; Hornero, G; Pinilla, MR; Rovira, C; Ramos, PM; Borges, B; Marques, H; Girao, PS;
PUBLICAÇÃO: 2014, FONTE: Waste Management, VOLUME: 34, NÚMERO: 4
INDEXADO EM: Scopus
Scopus NO MEU: 
ORCID
ORCID