Dário Jerónimo Pasadas
AuthID: R-004-V7M
31
TÃTULO: Using Excitation Invariance in the Characterization of Defects by Eddy Current Image Constructions
AUTORES: Lopes Ribeiro, AL; Pasadas, D; Ramos, HG ; Rocha, T;
PUBLICAÇÃO: 2014, FONTE: 1st International Conference on Structural Integrity (ICONS) in STRUCTURAL INTEGRITY, VOLUME: 86, NÚMERO: C
AUTORES: Lopes Ribeiro, AL; Pasadas, D; Ramos, HG ; Rocha, T;
PUBLICAÇÃO: 2014, FONTE: 1st International Conference on Structural Integrity (ICONS) in STRUCTURAL INTEGRITY, VOLUME: 86, NÚMERO: C
32
TÃTULO: Assessing metal plate thickness: An SVM approach with electromagnetic methods
AUTORES: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications in 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications, Proceedings
AUTORES: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications in 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications, Proceedings
INDEXADO EM: 
Scopus
Scopus33
TÃTULO: Velocity Induced Eddy Currents Technique to Inspect Cracks in Moving Conducting Media Full Text
AUTORES: Geirinhas Ramos, HMG ; Rocha, T; Dario Pasadas; Lopes Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTORES: Geirinhas Ramos, HMG ; Rocha, T; Dario Pasadas; Lopes Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
34
TÃTULO: Remote Field Eddy Current Inspection of Metallic Tubes Using GMR Sensors Full Text
AUTORES: Dario J Pasadas; Tiago J Rocha; Helena G Ramos ; Lopes Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTORES: Dario J Pasadas; Tiago J Rocha; Helena G Ramos ; Lopes Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
35
TÃTULO: Evaluation of portable ECT instruments with positioning capability Full Text
AUTORES: Dario Pasadas; Jorge J Rocha; Helena Geirinhas Ramos ; Lopes L Ribeiro ;
PUBLICAÇÃO: 2012, FONTE: MEASUREMENT, VOLUME: 45, NÚMERO: 3
AUTORES: Dario Pasadas; Jorge J Rocha; Helena Geirinhas Ramos ; Lopes L Ribeiro ;
PUBLICAÇÃO: 2012, FONTE: MEASUREMENT, VOLUME: 45, NÚMERO: 3
36
TÃTULO: Current around a Crack in an Aluminum Plate under Nondestructive Evaluation Inspection Full Text
AUTORES: Lopes Ribeiro, AL ; Geirinhas Ramos, HG ; Jeronimo Pasadas, DJ; Jorge Rocha, TJ;
PUBLICAÇÃO: 2012, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTORES: Lopes Ribeiro, AL ; Geirinhas Ramos, HG ; Jeronimo Pasadas, DJ; Jorge Rocha, TJ;
PUBLICAÇÃO: 2012, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
37
TÃTULO: Characterization of Defects on Rivets using a Eddy Current Technique with GMRs Full Text
AUTORES: Tiago Rocha; Dario Pasadas; Lopes Ribeiro, AL ; Helena M Ramos ;
PUBLICAÇÃO: 2012, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTORES: Tiago Rocha; Dario Pasadas; Lopes Ribeiro, AL ; Helena M Ramos ;
PUBLICAÇÃO: 2012, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
38
TÃTULO: Handheld Instrument to Detect Defects in Conductive Plates with a Planar Probe Full Text
AUTORES: Dario Pasadas; Helena Geirinhas Ramos ; Francisco Alegria ;
PUBLICAÇÃO: 2011, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTORES: Dario Pasadas; Helena Geirinhas Ramos ; Francisco Alegria ;
PUBLICAÇÃO: 2011, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
39
TÃTULO: Portable eddy current NDT instrument using two different implementations
AUTORES: Pasadas, D; Rocha, T; Ramos, H ; Ribeiro, AL ;
PUBLICAÇÃO: 2011, FONTE: International Conference on Computer as a Tool, EUROCON 2011 - Joint with Conftele 2011 in EUROCON 2011 - International Conference on Computer as a Tool - Joint with Conftele 2011
AUTORES: Pasadas, D; Rocha, T; Ramos, H ; Ribeiro, AL ;
PUBLICAÇÃO: 2011, FONTE: International Conference on Computer as a Tool, EUROCON 2011 - Joint with Conftele 2011 in EUROCON 2011 - International Conference on Computer as a Tool - Joint with Conftele 2011
INDEXADO EM: Scopus 
CrossRef
Scopus CrossRef40
TÃTULO: 2D Magnetic Field Mobile Sensing System for Eddy Current Testing
AUTORES: Bruno Silva; Dario Pasadas; Frederico Carvalho; Pedro Agulha; Octavian Postolache ; Helena G Ramos ; Lopes Ribeiro, AL ; Correa Alegria, FC ;
PUBLICAÇÃO: 2009, FONTE: 8th IEEE Conference on Sensors in 2009 IEEE SENSORS, VOLS 1-3
AUTORES: Bruno Silva; Dario Pasadas; Frederico Carvalho; Pedro Agulha; Octavian Postolache ; Helena G Ramos ; Lopes Ribeiro, AL ; Correa Alegria, FC ;
PUBLICAÇÃO: 2009, FONTE: 8th IEEE Conference on Sensors in 2009 IEEE SENSORS, VOLS 1-3
