C. Jeynes
AuthID: R-006-GF6
21
TITLE: Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data Full Text
AUTHORS: Jeynes, C; Barradas, NP ; Wilde, JR; Greer, AL;
PUBLISHED: 2000, SOURCE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161
AUTHORS: Jeynes, C; Barradas, NP ; Wilde, JR; Greer, AL;
PUBLISHED: 2000, SOURCE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161
22
TITLE: Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing Full Text
AUTHORS: Barradas, NP ; Jeynes, C; Webb, RP; Kreissig, U; Grotzschel, R;
PUBLISHED: 1999, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 149, ISSUE: 1-2
AUTHORS: Barradas, NP ; Jeynes, C; Webb, RP; Kreissig, U; Grotzschel, R;
PUBLISHED: 1999, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 149, ISSUE: 1-2
23
TITLE: Bayesian error analysis of Rutherford backscattering spectra Full Text
AUTHORS: Barradas, NP ; Jeynes, C; Jenkin, M; Marriott, PK;
PUBLISHED: 1999, SOURCE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, ISSUE: 1-2
AUTHORS: Barradas, NP ; Jeynes, C; Jenkin, M; Marriott, PK;
PUBLISHED: 1999, SOURCE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, ISSUE: 1-2
24
TITLE: Growth of microcrystalline beta-SiC films on silicon by ECR plasma CVD Full Text
AUTHORS: Toal, SJ; Reehal, HS; Barradas, NP ; Jeynes, C;
PUBLISHED: 1999, SOURCE: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96) in APPLIED SURFACE SCIENCE, VOLUME: 138, ISSUE: 1-4
AUTHORS: Toal, SJ; Reehal, HS; Barradas, NP ; Jeynes, C;
PUBLISHED: 1999, SOURCE: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96) in APPLIED SURFACE SCIENCE, VOLUME: 138, ISSUE: 1-4
25
TITLE: High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms
AUTHORS: Barradas, NP ; Knights, AP; Jeynes, C; Mironov, OA; Grasby, TJ; Parker, EHC;
PUBLISHED: 1999, SOURCE: PHYSICAL REVIEW B, VOLUME: 59, ISSUE: 7
AUTHORS: Barradas, NP ; Knights, AP; Jeynes, C; Mironov, OA; Grasby, TJ; Parker, EHC;
PUBLISHED: 1999, SOURCE: PHYSICAL REVIEW B, VOLUME: 59, ISSUE: 7
26
TITLE: Rapid accurate automated analysis of complex ion beam analysis data
AUTHORS: Marriott, PK; Jenkin, M; Jeynes, C; Barradas, NP ; Webb, RP; Sealy, BJ;
PUBLISHED: 1999, SOURCE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
AUTHORS: Marriott, PK; Jenkin, M; Jeynes, C; Barradas, NP ; Webb, RP; Sealy, BJ;
PUBLISHED: 1999, SOURCE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
INDEXED IN: 
WOS
WOS27
TITLE: RES and ERDA study of ion beam synthesised amorphous gallium nitride Full Text
AUTHORS: Barradas, NP ; Almeida, SA; Jeynes, C; Knights, AP; Silva, SRP; Sealy, BJ;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4
AUTHORS: Barradas, NP ; Almeida, SA; Jeynes, C; Knights, AP; Silva, SRP; Sealy, BJ;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4
28
TITLE: RBS/simulated annealing and FTIR characterisation of BCN films deposited by dual cathode magnetron sputtering
AUTHORS: Barradas, NP ; Jeynes, C; Kusano, Y; Evetts, JE; Hutchings, IM;
PUBLISHED: 1999, SOURCE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
AUTHORS: Barradas, NP ; Jeynes, C; Kusano, Y; Evetts, JE; Hutchings, IM;
PUBLISHED: 1999, SOURCE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
INDEXED IN: WOS
WOS29
TITLE: Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD Full Text
AUTHORS: Toal, SJ; Reehal, HS; Webb, SJ; Barradas, NP ; Jeynes, C;
PUBLISHED: 1999, SOURCE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, ISSUE: 1-2
AUTHORS: Toal, SJ; Reehal, HS; Webb, SJ; Barradas, NP ; Jeynes, C;
PUBLISHED: 1999, SOURCE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, ISSUE: 1-2
30
TITLE: The influence of implantation and annealing conditions on optical activity of Er3+ ions in 6H SiC Full Text
AUTHORS: Kozanecki, A; Jeynes, C; Barradas, NP ; Sealy, BJ; Jantsch, W;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4
AUTHORS: Kozanecki, A; Jeynes, C; Barradas, NP ; Sealy, BJ; Jantsch, W;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4
