Artur Fernando Delgado Lopes Ribeiro
AuthID: R-000-2K6
31
TÃTULO: Eddy current testing of cracks using multi-frequency and noise excitation
AUTORES: Pasadas, DJ; Ribeiro, AL; Ramos, HG ; Feng, B; Baskaran, P;
PUBLICAÇÃO: 2018, FONTE: 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 in I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, Proceedings
AUTORES: Pasadas, DJ; Ribeiro, AL; Ramos, HG ; Feng, B; Baskaran, P;
PUBLICAÇÃO: 2018, FONTE: 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 in I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, Proceedings
INDEXADO EM: 
Scopus
Scopus32
TÃTULO: A new method to detect delamination in composites using chirp-excited Lamb wave and wavelet analysis Full Text
AUTORES: Feng, B; Ribeiro, AL; Ramos, HG ;
PUBLICAÇÃO: 2018, FONTE: NDT & E INTERNATIONAL, VOLUME: 100
AUTORES: Feng, B; Ribeiro, AL; Ramos, HG ;
PUBLICAÇÃO: 2018, FONTE: NDT & E INTERNATIONAL, VOLUME: 100
33
TÃTULO: Comparison of Inspecting Non-Ferromagnetic and Ferromagnetic Metals Using Velocity Induced Eddy Current Probe Full Text
AUTORES: Feng, B; Ribeiro, AL; Rocha, TJ; Ramos, HG ;
PUBLICAÇÃO: 2018, FONTE: SENSORS, VOLUME: 18, NÚMERO: 10
AUTORES: Feng, B; Ribeiro, AL; Rocha, TJ; Ramos, HG ;
PUBLICAÇÃO: 2018, FONTE: SENSORS, VOLUME: 18, NÚMERO: 10
34
TÃTULO: Lamb Wave Characterization of Crack Depth in Aluminum Plates using Artificial Neural Networks
AUTORES: Bo Feng; Artur Lopes Ribeiro; Helena Geirinhas Ramos ;
PUBLICAÇÃO: 2018, FONTE: IEEE Far East NDT New Technology & Application Forum (IEEE FENDT) in PROCEEDINGS OF 2018 IEEE FAR EAST NDT NEW TECHNOLOGY & APPLICATION FORUM (IEEE FENDT 2018)
AUTORES: Bo Feng; Artur Lopes Ribeiro; Helena Geirinhas Ramos ;
PUBLICAÇÃO: 2018, FONTE: IEEE Far East NDT New Technology & Application Forum (IEEE FENDT) in PROCEEDINGS OF 2018 IEEE FAR EAST NDT NEW TECHNOLOGY & APPLICATION FORUM (IEEE FENDT 2018)
INDEXADO EM: Scopus 
WOS
Scopus WOS35
TÃTULO: Inspection of Cracks in Aluminum Multilayer Structures Using Planar ECT Probe and Inversion Problem
AUTORES: Pasadas, DJ; Ribeiro, AL; Ramos, HG ; Rocha, TJ;
PUBLICAÇÃO: 2017, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 66, NÚMERO: 5
AUTORES: Pasadas, DJ; Ribeiro, AL; Ramos, HG ; Rocha, TJ;
PUBLICAÇÃO: 2017, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 66, NÚMERO: 5
36
TÃTULO: Mapping of Impact Damage in Composite Materials Using Differential ECT Probe
AUTORES: Angani, CS; Pasadas, DJ; Ribeiro, AL; Ramos, HG ;
PUBLICAÇÃO: 2017, FONTE: International Workshop on Electromagnetic Nondestructive Evaluation (ENDE) in ELECTROMAGNETIC NONDESTRUCTIVE EVALUATION (XX), VOLUME: 42
AUTORES: Angani, CS; Pasadas, DJ; Ribeiro, AL; Ramos, HG ;
PUBLICAÇÃO: 2017, FONTE: International Workshop on Electromagnetic Nondestructive Evaluation (ENDE) in ELECTROMAGNETIC NONDESTRUCTIVE EVALUATION (XX), VOLUME: 42
37
TÃTULO: ECT with uniform current distribution for the inspection of sub-surface cracks in conductive plates
AUTORES: Pasadas, DJ; Ribeiro, AL; Ramos, HG ;
PUBLICAÇÃO: 2017, FONTE: 15th IMEKO TC10 Workshop on Technical Diagnostics 2017: Technical Diagnostics in CyberPhysical Era in 15th IMEKO TC10 Workshop on Technical Diagnostics 2017 - "Technical Diagnostics in Cyber-Physical Era"
AUTORES: Pasadas, DJ; Ribeiro, AL; Ramos, HG ;
PUBLICAÇÃO: 2017, FONTE: 15th IMEKO TC10 Workshop on Technical Diagnostics 2017: Technical Diagnostics in CyberPhysical Era in 15th IMEKO TC10 Workshop on Technical Diagnostics 2017 - "Technical Diagnostics in Cyber-Physical Era"
INDEXADO EM: Scopus
Scopus38
TÃTULO: Preface
AUTORES: Helena G Ramos ; Artur L Ribeiro;
PUBLICAÇÃO: 2017, FONTE: Studies in Applied Electromagnetics and Mechanics, VOLUME: 42
AUTORES: Helena G Ramos ; Artur L Ribeiro;
PUBLICAÇÃO: 2017, FONTE: Studies in Applied Electromagnetics and Mechanics, VOLUME: 42
INDEXADO EM: Scopus
Scopus39
TÃTULO: 2D surface defect images applying Tikhonov regularized inversion and ECT Full Text
AUTORES: Pasadas, DJ; Ribeiro, AL; Rocha, T; Ramos, HG ;
PUBLICAÇÃO: 2016, FONTE: NDT & E INTERNATIONAL, VOLUME: 80
AUTORES: Pasadas, DJ; Ribeiro, AL; Rocha, T; Ramos, HG ;
PUBLICAÇÃO: 2016, FONTE: NDT & E INTERNATIONAL, VOLUME: 80
40
TÃTULO: Evaluation of Subsurface Defects Using Diffusion of Motion-Induced Eddy Currents
AUTORES: Tiago Jorge Rocha; Helena G Ramos ; Artur Lopes Ribeiro; Dario Jeronimo Pasadas;
PUBLICAÇÃO: 2016, FONTE: 32nd Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 65, NÚMERO: 5
AUTORES: Tiago Jorge Rocha; Helena G Ramos ; Artur Lopes Ribeiro; Dario Jeronimo Pasadas;
PUBLICAÇÃO: 2016, FONTE: 32nd Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 65, NÚMERO: 5
