Artur Fernando Delgado Lopes Ribeiro
AuthID: R-000-2K6
81
TÃTULO: Metal plate thickness classification in eddy current testing using support vector machine
AUTORES: Rocha, T; Pasadas, D; Ramos, HG; Ribeiro, AL;
PUBLICAÇÃO: 2013, FONTE: 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing in 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
AUTORES: Rocha, T; Pasadas, D; Ramos, HG; Ribeiro, AL;
PUBLICAÇÃO: 2013, FONTE: 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing in 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
INDEXADO EM:
Scopus
NO MEU:
ORCID
82
TÃTULO: Assessing metal plate thickness: An SVM approach with electromagnetic methods
AUTORES: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL;
PUBLICAÇÃO: 2013, FONTE: 12th IMEKO TC10 Workshop on New Perspectives in Measurements, Tools and Techniques for Industrial Applications 2013 in 12th IMEKO TC10 Workshop on New Perspectives in Measurements, Tools and Techniques for Industrial Applications 2013
AUTORES: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL;
PUBLICAÇÃO: 2013, FONTE: 12th IMEKO TC10 Workshop on New Perspectives in Measurements, Tools and Techniques for Industrial Applications 2013 in 12th IMEKO TC10 Workshop on New Perspectives in Measurements, Tools and Techniques for Industrial Applications 2013
INDEXADO EM:
Scopus
NO MEU:
ORCID
83
TÃTULO: Using giant magneto-resistance sensors in remote field eddy current tube inspection
AUTORES: Ribeiro, AL; Ramos, HMG ; Pasadas, D; Rocha, T;
PUBLICAÇÃO: 2013, FONTE: 12th IMEKO TC10 Workshop on New Perspectives in Measurements, Tools and Techniques for Industrial Applications 2013 in 12th IMEKO TC10 Workshop on New Perspectives in Measurements, Tools and Techniques for Industrial Applications 2013
AUTORES: Ribeiro, AL; Ramos, HMG ; Pasadas, D; Rocha, T;
PUBLICAÇÃO: 2013, FONTE: 12th IMEKO TC10 Workshop on New Perspectives in Measurements, Tools and Techniques for Industrial Applications 2013 in 12th IMEKO TC10 Workshop on New Perspectives in Measurements, Tools and Techniques for Industrial Applications 2013
INDEXADO EM:
Scopus
NO MEU:
ORCID
84
TÃTULO: Electrical Characterization of a Magnetic Tunnel Junction Current Sensor for Industrial Applications
AUTORES: Sanchez, J; Ramirez, D; Ravelo, SI; Lopes, A; Cardoso, S ; Ferreira, R; Freitas, PP ;
PUBLICAÇÃO: 2012, FONTE: International Magnetics Conference (INTERMAG) in IEEE TRANSACTIONS ON MAGNETICS, VOLUME: 48, NÚMERO: 11
AUTORES: Sanchez, J; Ramirez, D; Ravelo, SI; Lopes, A; Cardoso, S ; Ferreira, R; Freitas, PP ;
PUBLICAÇÃO: 2012, FONTE: International Magnetics Conference (INTERMAG) in IEEE TRANSACTIONS ON MAGNETICS, VOLUME: 48, NÚMERO: 11
85
TÃTULO: Eddy current nondestructive testing using faraday induction to produce the excitation
AUTORES: Ramos, HG; Rocha, T; Pasadas, D; Ribeiro, AL;
PUBLICAÇÃO: 2012, FONTE: 20th IMEKO World Congress 2012 in 20th IMEKO World Congress 2012, VOLUME: 2
AUTORES: Ramos, HG; Rocha, T; Pasadas, D; Ribeiro, AL;
PUBLICAÇÃO: 2012, FONTE: 20th IMEKO World Congress 2012 in 20th IMEKO World Congress 2012, VOLUME: 2
INDEXADO EM:
Scopus
NO MEU:
ORCID
86
TÃTULO: Measuring interface for an ECT System
AUTORES: Helena Geirinhas Ramos ; Artur Lopes Ribeiro; Michal Kubinyi;
PUBLICAÇÃO: 2011, FONTE: PRZEGLAD ELEKTROTECHNICZNY, VOLUME: 87, NÚMERO: 7
AUTORES: Helena Geirinhas Ramos ; Artur Lopes Ribeiro; Michal Kubinyi;
PUBLICAÇÃO: 2011, FONTE: PRZEGLAD ELEKTROTECHNICZNY, VOLUME: 87, NÚMERO: 7
INDEXADO EM:
WOS
NO MEU:
ORCID
87
TÃTULO: Chemical shrinkage of pastes made with shrinkage reducing admixtures
AUTORES: Ribeiro, AB; Medina, V; Gomes, A; Goncalves, A;
PUBLICAÇÃO: 2011, FONTE: Key Engineering Materials, VOLUME: 466
AUTORES: Ribeiro, AB; Medina, V; Gomes, A; Goncalves, A;
PUBLICAÇÃO: 2011, FONTE: Key Engineering Materials, VOLUME: 466
INDEXADO EM:
Scopus
CrossRef
CrossRef88
TÃTULO: Modeling eddy current inspection of a metallic sample with round hole defects
AUTORES: Ramos, HG ; Ribeiro, AL; Posadas, D; Rocha, T;
PUBLICAÇÃO: 2011, FONTE: 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011 in 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011
AUTORES: Ramos, HG ; Ribeiro, AL; Posadas, D; Rocha, T;
PUBLICAÇÃO: 2011, FONTE: 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011 in 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011
INDEXADO EM:
Scopus
NO MEU:
ORCID
89
TÃTULO: Uniform eddy current probe implementation using planar excitation coil and GMR sensor array
AUTORES: Postolache, O; Ribeiro, AL; Ramos, H;
PUBLICAÇÃO: 2011, FONTE: 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011 in 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011
AUTORES: Postolache, O; Ribeiro, AL; Ramos, H;
PUBLICAÇÃO: 2011, FONTE: 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011 in 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011
INDEXADO EM:
Scopus
NO MEU:
ORCID
90
TÃTULO: Thickness measurement of a nonmagnetic metallic plate using harmonic eddy current excitation and a GMR sensor
AUTORES: Ribeiro, AL; Ramos, HG ; Arez, JC;
PUBLICAÇÃO: 2011, FONTE: 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011 in 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011
AUTORES: Ribeiro, AL; Ramos, HG ; Arez, JC;
PUBLICAÇÃO: 2011, FONTE: 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011 in 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011
INDEXADO EM:
Scopus
NO MEU:
ORCID