Clara Piccirillo
AuthID: R-000-Y4V
61
TITLE: Why does diamond absorb infra-red radiation? Full Text
AUTHORS: Davies, G; Mainwood, A; Piccirillo, C; Lewis, KL; Mollart, TP; Nesladek, M; Remes, Z;
PUBLISHED: 2002, SOURCE: 7th International Workshop on Surface and Bulk Defects in CVD Diamond Films (SBDD) in Physica Status Solidi (A) Applied Research, VOLUME: 193, ISSUE: 3
AUTHORS: Davies, G; Mainwood, A; Piccirillo, C; Lewis, KL; Mollart, TP; Nesladek, M; Remes, Z;
PUBLISHED: 2002, SOURCE: 7th International Workshop on Surface and Bulk Defects in CVD Diamond Films (SBDD) in Physica Status Solidi (A) Applied Research, VOLUME: 193, ISSUE: 3
62
TITLE: Temperature dependence of intrinsic infrared absorption in natural and chemical-vapor deposited diamond Full Text
AUTHORS: Piccirillo, C; Davies, G; Mainwood, A; Scarle, S; Penchina, CM; Mollart, TP; Lewis, KL; Nesladek, M; Remes, Z; Pickles, CSJ;
PUBLISHED: 2002, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 92, ISSUE: 2
AUTHORS: Piccirillo, C; Davies, G; Mainwood, A; Scarle, S; Penchina, CM; Mollart, TP; Lewis, KL; Nesladek, M; Remes, Z; Pickles, CSJ;
PUBLISHED: 2002, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 92, ISSUE: 2
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ORCID | ResearcherID63
TITLE: Secondary ion mass spectrometric investigation of Au-based composites Full Text
AUTHORS: Barison, S; Piccirillo, C; Fabrizio, M; Daolio, S;
PUBLISHED: 2001, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 15, ISSUE: 21
AUTHORS: Barison, S; Piccirillo, C; Fabrizio, M; Daolio, S;
PUBLISHED: 2001, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 15, ISSUE: 21
64
TITLE: Composition and microstructure of cobalt oxide thin films obtained from a novel cobalt(II) precursor by chemical vapor deposition Full Text
AUTHORS: Barreca, D; Massignan, C; Daolio, S; Fabrizio, M; Piccirillo, C; Armelao, L; Tondello, E;
PUBLISHED: 2001, SOURCE: CHEMISTRY OF MATERIALS, VOLUME: 13, ISSUE: 2
AUTHORS: Barreca, D; Massignan, C; Daolio, S; Fabrizio, M; Piccirillo, C; Armelao, L; Tondello, E;
PUBLISHED: 2001, SOURCE: CHEMISTRY OF MATERIALS, VOLUME: 13, ISSUE: 2
IN MY: ORCID | ResearcherID
ORCID | ResearcherID65
TITLE: Secondary ion mass spectrometry in the characterisation of boron-based ceramics Full Text
AUTHORS: Daolio, S; Fabrizio, M; Piccirillo, C; Muolo, ML; Passerone, A; Bellosi, A;
PUBLISHED: 2001, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 15, ISSUE: 1
AUTHORS: Daolio, S; Fabrizio, M; Piccirillo, C; Muolo, ML; Passerone, A; Bellosi, A;
PUBLISHED: 2001, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 15, ISSUE: 1
66
TITLE: The variation of optical absorption of CVD diamond as a function of temperature Full Text
AUTHORS: Piccirillo, C; Davies, G; Mainwood, A; Penchina, CM;
PUBLISHED: 2001, SOURCE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308
AUTHORS: Piccirillo, C; Davies, G; Mainwood, A; Penchina, CM;
PUBLISHED: 2001, SOURCE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308
IN MY: ORCID | ResearcherID
ORCID | ResearcherID67
TITLE: Surface chemistry of RuO2/IrO2/TiO2 mixed-oxide electrodes: Secondary ion mass spectrometric study of the changes induced by electrochemical treatment Full Text
AUTHORS: Barison, S; De Battisti, A; Fabrizio, M; Daolio, S; Piccirillo, C;
PUBLISHED: 2000, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 14, ISSUE: 23
AUTHORS: Barison, S; De Battisti, A; Fabrizio, M; Daolio, S; Piccirillo, C;
PUBLISHED: 2000, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 14, ISSUE: 23
68
TITLE: Characterization of dispersion-hardened electrodeposited gold composites. Part 1: SIMS and SEM study of powder inclusions Full Text
AUTHORS: Barison, S; Daolio, S; Fabrizio, M; Piccirillo, C; Calliari, I; Armelao, L;
PUBLISHED: 2000, SOURCE: CHEMISTRY OF MATERIALS, VOLUME: 12, ISSUE: 10
AUTHORS: Barison, S; Daolio, S; Fabrizio, M; Piccirillo, C; Calliari, I; Armelao, L;
PUBLISHED: 2000, SOURCE: CHEMISTRY OF MATERIALS, VOLUME: 12, ISSUE: 10
IN MY: ORCID | ResearcherID
ORCID | ResearcherID69
TITLE: Secondary ion mass spectrometric investigation on ruthenium oxide systems: A comparison between poly- and nanocrystalline deposits Full Text
AUTHORS: Barison, S; Barreca, D; Daolio, S; Fabrizio, M; Piccirillo, C;
PUBLISHED: 2000, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 14, ISSUE: 14
AUTHORS: Barison, S; Barreca, D; Daolio, S; Fabrizio, M; Piccirillo, C;
PUBLISHED: 2000, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 14, ISSUE: 14
70
TITLE: Investigations on the formation of RuO2/ZrO2-based electrocatalytic thin films by surface analysis techniques Full Text
AUTHORS: Kristof, J; Daolio, S; De Battisti, A; Piccirillo, C; Mihaly, J; Horvath, E;
PUBLISHED: 1999, SOURCE: LANGMUIR, VOLUME: 15, ISSUE: 4
AUTHORS: Kristof, J; Daolio, S; De Battisti, A; Piccirillo, C; Mihaly, J; Horvath, E;
PUBLISHED: 1999, SOURCE: LANGMUIR, VOLUME: 15, ISSUE: 4
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