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TITLE: Characterization of TiAl alloys by secondary ion mass spectrometry
AUTHORS: Barbosa, J ; Teodoro, OMND ; Moutinho, AMC ; Ribeiro, S; Monteiro, C;
PUBLISHED: 2004, SOURCE: 2nd International Materials Symposium in ADVANCED MATERIALS FORUM II, VOLUME: 455-456
INDEXED IN: Scopus WOS
33
TITLE: Development and validation of computational tools for temperature testing
AUTHORS: Ribeiro, AS; Castro, MP; Correia, JG;
PUBLISHED: 2002, SOURCE: 8th International Symposium on Temperature and Thermal Measurements in Industry and Science in TEMPMEKO 2001: 8TH INTERNATIONAL SYMPOSIUM ON TEMPERATURE AND THERMAL MEASUREMENT IN INDUSTRY AND SCIENCE, VOL 1 & 2, PROCEEDINGS
INDEXED IN: WOS
Página 4 de 4. Total de resultados: 33.