Bogdan Postolnyi
AuthID: R-00H-4VS
11
TÃTULO: Structural analysis of multilayer metal nitride films CrN/MoN using electron backscatter diffraction (EBSD)
AUTORES: Bogdan Postolnyi; Oleksandr Bondar; Marek Opielak; Przemyslaw Rogalski; Joao Pedro Araujo ;
PUBLICAÇÃO: 2016, FONTE: 8th International Conference on Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies (ATOM-N) in ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VIII, VOLUME: 10010
AUTORES: Bogdan Postolnyi; Oleksandr Bondar; Marek Opielak; Przemyslaw Rogalski; Joao Pedro Araujo ;
PUBLICAÇÃO: 2016, FONTE: 8th International Conference on Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies (ATOM-N) in ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VIII, VOLUME: 10010
