Bogdan Postolnyi
AuthID: R-00H-4VS
11
TÃTULO: Structural Analysis of Arc-PVD Multilayer Metal Nitride Coatings CrN/MoN Using Electron Backscatter Diffraction (EBSD)
AUTORES: Postolnyi, BO; Araujo, JP ;
PUBLICAÇÃO: 2016, FONTE: 6th International Conference on Nanomaterials - Applications & Properties (NAP) in INTERNATIONAL CONFERENCE ON NANOMATERIALS: APPLICATION & PROPERTIES (NAP)
AUTORES: Postolnyi, BO; Araujo, JP ;
PUBLICAÇÃO: 2016, FONTE: 6th International Conference on Nanomaterials - Applications & Properties (NAP) in INTERNATIONAL CONFERENCE ON NANOMATERIALS: APPLICATION & PROPERTIES (NAP)
INDEXADO EM: 
WOS
WOS12
TÃTULO: Structural analysis of multilayer metal nitride films CrN/MoN using electron backscatter diffraction (EBSD)
AUTORES: Bogdan Postolnyi; Oleksandr Bondar; Marek Opielak; Przemyslaw Rogalski; Joao Pedro Araujo ;
PUBLICAÇÃO: 2016, FONTE: 8th International Conference on Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies (ATOM-N) in ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VIII, VOLUME: 10010
AUTORES: Bogdan Postolnyi; Oleksandr Bondar; Marek Opielak; Przemyslaw Rogalski; Joao Pedro Araujo ;
PUBLICAÇÃO: 2016, FONTE: 8th International Conference on Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies (ATOM-N) in ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VIII, VOLUME: 10010
