Angus Kingon
AuthID: R-001-R5B
11
TITLE: Microstructural Characterization of Thick PZT films on Cu Foils Deposited by Electrophoresis
AUTHORS: Aiying Y Wu; Vilarinho, PM ; Kingon, AI; Reaney, I;
PUBLISHED: 2008, SOURCE: MICROSCOPY AND MICROANALYSIS, VOLUME: 14, ISSUE: SUPPL. 3
AUTHORS: Aiying Y Wu; Vilarinho, PM ; Kingon, AI; Reaney, I;
PUBLISHED: 2008, SOURCE: MICROSCOPY AND MICROANALYSIS, VOLUME: 14, ISSUE: SUPPL. 3
12
TITLE: Low dielectric loss BaNd2Ti5O14 thick films prepared by an electrophoretic deposition technique Full Text
AUTHORS: Zhi Fu; Aiying Y Wu; Vilarinho, PM ; Kingon, AI; Woerdenweber, R;
PUBLISHED: 2007, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 90, ISSUE: 5
AUTHORS: Zhi Fu; Aiying Y Wu; Vilarinho, PM ; Kingon, AI; Woerdenweber, R;
PUBLISHED: 2007, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 90, ISSUE: 5
13
TITLE: Electrophoretic deposition of lead zirconate titanate films on metal foils for embedded components Full Text
AUTHORS: Wu, AY; Vilarinho, PM ; Kingon, AI;
PUBLISHED: 2006, SOURCE: JOURNAL OF THE AMERICAN CERAMIC SOCIETY, VOLUME: 89, ISSUE: 2
AUTHORS: Wu, AY; Vilarinho, PM ; Kingon, AI;
PUBLISHED: 2006, SOURCE: JOURNAL OF THE AMERICAN CERAMIC SOCIETY, VOLUME: 89, ISSUE: 2
14
TITLE: Asymmetric nanoscale switching in ferroelectric thin films by scanning force microscopy Full Text
AUTHORS: Gruverman, A; Kholkin, A ; Kingon, A; Tokumoto, H;
PUBLISHED: 2001, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 78, ISSUE: 18
AUTHORS: Gruverman, A; Kholkin, A ; Kingon, A; Tokumoto, H;
PUBLISHED: 2001, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 78, ISSUE: 18
15
TITLE: Thin film capacitors embedded into high density printed circuit boards
AUTHORS: Kingon, AI; Kim, T; Vilarinho, P ; Maria, JP; Crosswell, RT;
PUBLISHED: 2001, SOURCE: 2001 International Symposium on Microelectronics in Proceedings of SPIE - The International Society for Optical Engineering, VOLUME: 4587
AUTHORS: Kingon, AI; Kim, T; Vilarinho, P ; Maria, JP; Crosswell, RT;
PUBLISHED: 2001, SOURCE: 2001 International Symposium on Microelectronics in Proceedings of SPIE - The International Society for Optical Engineering, VOLUME: 4587
INDEXED IN: 
Scopus
Scopus