João Paulo Cacho Teixeira
AuthID: R-000-7A4
151
TÃTULO: Test resource partitioning: a design & test issue
AUTORES: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLICAÇÃO: 2001, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
AUTORES: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLICAÇÃO: 2001, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
152
TÃTULO: Towards e-management as enabler for accelerated change
AUTORES: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
AUTORES: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
INDEXADO EM: 
Scopus
Scopus153
TÃTULO: RTL-based functional test generation for high defects coverage in digital SOCs
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXADO EM: 
WOS
WOS154
TÃTULO: MOSYS: A methodology for automatic object identification from system specification
AUTORES: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
AUTORES: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
INDEXADO EM: Scopus 
CrossRef
Scopus CrossRef155
TÃTULO: Metrics and criteria for quality assessment of testable Hw Sw systems architectures Full Text
AUTORES: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLICAÇÃO: 1999, FONTE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, NÚMERO: 1-2
AUTORES: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLICAÇÃO: 1999, FONTE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, NÚMERO: 1-2
156
TÃTULO: Testability issues in the CMS ECAL upper-level readout and trigger system
AUTORES: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLICAÇÃO: 1999, FONTE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
AUTORES: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLICAÇÃO: 1999, FONTE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
INDEXADO EM: WOS
WOS157
TÃTULO: From continuing education to continuing learning using self assessment and process monitoring
AUTORES: Teixeira, IC; Teixeira, JP; Pile, M; Durao, D;
PUBLICAÇÃO: 1998, FONTE: 7th World Conference on Continuing Engineering Education: the Knowledge Revolution - the Impact of New Technologies o n Learning in KNOWLEDGE REVOLUTION, THE IMPACT OF TECHNOLOGY ON LEARNING, PROCEEDINGS
AUTORES: Teixeira, IC; Teixeira, JP; Pile, M; Durao, D;
PUBLICAÇÃO: 1998, FONTE: 7th World Conference on Continuing Engineering Education: the Knowledge Revolution - the Impact of New Technologies o n Learning in KNOWLEDGE REVOLUTION, THE IMPACT OF TECHNOLOGY ON LEARNING, PROCEEDINGS
INDEXADO EM: WOS
WOS158
TÃTULO: Trends on microelectronic systems education
AUTORES: Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 1998, FONTE: 2nd European Workshop on Microelectronics Education in MICROELECTRONICS EDUCATION
AUTORES: Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 1998, FONTE: 2nd European Workshop on Microelectronics Education in MICROELECTRONICS EDUCATION
INDEXADO EM: WOS
WOS159
TÃTULO: High-quality physical designs of CMOS ICs
AUTORES: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLICAÇÃO: 1991, FONTE: Euro ASIC 1991 in Euro ASIC 1991
AUTORES: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLICAÇÃO: 1991, FONTE: Euro ASIC 1991 in Euro ASIC 1991
INDEXADO EM: Scopus
Scopus