José Miguel Costa Dias Pereira
AuthID: R-000-8RJ
171
TÃTULO: Neural network application in a carbon monoxide measurement system
AUTORES: Postolache, O ; Girao, P; Pereira, M;
PUBLICAÇÃO: 2001, FONTE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTORES: Postolache, O ; Girao, P; Pereira, M;
PUBLICAÇÃO: 2001, FONTE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
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172
TÃTULO: Neural networks in automated measurement systems: State of the art and new research trends
AUTORES: Postolache, O ; Girao, P; Pereira, M;
PUBLICAÇÃO: 2001, FONTE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTORES: Postolache, O ; Girao, P; Pereira, M;
PUBLICAÇÃO: 2001, FONTE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
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173
TÃTULO: Extending digital input/output capabilities to low-cost and NON-linear a/d conversion
AUTORES: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
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174
TÃTULO: Microcontroller - based data processing for non-linear measuring sensors
AUTORES: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
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175
TÃTULO: Laser based smart displacement sensor
AUTORES: Postolache O.; Pereira M.; Girão P.;
PUBLICAÇÃO: 2001, FONTE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
AUTORES: Postolache O.; Pereira M.; Girão P.;
PUBLICAÇÃO: 2001, FONTE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
176
TÃTULO: Automated characterization of a bifurcated optical fiber bundle displacement sensor taking into account reflector tilting perturbation effects
AUTORES: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLICAÇÃO: 2000, FONTE: Microwave and Optical Technology Letters, VOLUME: 26, NÚMERO: 4
AUTORES: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLICAÇÃO: 2000, FONTE: Microwave and Optical Technology Letters, VOLUME: 26, NÚMERO: 4
177
TÃTULO: Dithered ADC systems in the presence of hysteresis errors Full Text
AUTORES: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLICAÇÃO: 1999, FONTE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
AUTORES: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLICAÇÃO: 1999, FONTE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
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178
TÃTULO: Minimising temperature drift errors of conditioning circuits using artificial neural networks Full Text
AUTORES: Pereira, JMD; Postolache, O ; Girao, PS ; Cretu, M;
PUBLICAÇÃO: 1998, FONTE: 15th Annual IEEE Instrumentation and Measurement Technology Conference on Where Instrumentation is Going (IMTC 98) in WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, VOLUME: 1
AUTORES: Pereira, JMD; Postolache, O ; Girao, PS ; Cretu, M;
PUBLICAÇÃO: 1998, FONTE: 15th Annual IEEE Instrumentation and Measurement Technology Conference on Where Instrumentation is Going (IMTC 98) in WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, VOLUME: 1
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179
TÃTULO: New virtual instrument for temperature measurement based on a photodiode excited by a laser source
AUTORES: Postolache, O ; Dias M D Pereira; Silva S Girao; Cruz C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 9th Mediterranean Electrotechnical Conference, MELECON. Part 2 (of 2) in Proceedings of the Mediterranean Electrotechnical Conference - MELECON, VOLUME: 2
AUTORES: Postolache, O ; Dias M D Pereira; Silva S Girao; Cruz C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 9th Mediterranean Electrotechnical Conference, MELECON. Part 2 (of 2) in Proceedings of the Mediterranean Electrotechnical Conference - MELECON, VOLUME: 2
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180
TÃTULO: A temperature sensor fault detector as an Artificial Neural Network application
AUTORES: Postelache, O ; Girao, PS; Ramos, HG ; Pereira, JMD;
PUBLICAÇÃO: 1998, FONTE: 9th Mediterranean Electrotechnical Conference (Melecon 98) in MELECON '98 - 9TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, VOLS 1 AND 2
AUTORES: Postelache, O ; Girao, PS; Ramos, HG ; Pereira, JMD;
PUBLICAÇÃO: 1998, FONTE: 9th Mediterranean Electrotechnical Conference (Melecon 98) in MELECON '98 - 9TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, VOLS 1 AND 2
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