Toggle navigation
Publicações
Investigadores
Instituições
0
Entrar
Autenticação Federada
(Click on the image)
Autenticação local
Recuperação de Password
Register
Entrar
Publicações
Procurar
Estatísticas
Mechanical Properties of Thin Silicon Films Deposited at Low Temperatures by Pecvd
AuthID
P-003-8T3
4
Author(s)
Gaspar, J
·
Paul, O
·
Chu, V
·
Conde, JP
Document Type
Article
Year published
2010
Published
in
JOURNAL OF MICROMECHANICS AND MICROENGINEERING,
ISSN: 0960-1317
Volume: 20, Issue: 3, Pages: 035022 (6)
Indexing
Wos
®
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1088/0960-1317/20/3/035022
Scopus
: 2-s2.0-77749311363
Wos
: WOS:000275331300022
Source Identifiers
ISSN
: 0960-1317
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Lista
Marked
Adicionar à lista
Marked
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service