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Development of an Electrical Power Quality Monitor Based on a Pc

AuthID
P-003-QG1

Author(s)

Alves, R

Document Type

Proceedings Paper

Year published

2009

Published

in IECON: 2009 35TH ANNUAL CONFERENCE OF IEEE INDUSTRIAL ELECTRONICS, VOLS 1-6

Pages: 3473-3477 (5)

Conference

35Th Annual Conference of the Ieee-Industrial-Electronics-Society (Iecon 2009), Date: NOV 03-05, 2009, Location: Porto, PORTUGAL, Sponsors: IEEE Ind Elect Soc

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Sources

Publication Identifiers

DOI: 10.1109/iecon.2009.5415142

Scopus: 2-s2.0-77951548942

Wos: WOS:000280762001208

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