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10Th Latin American Test Workshop, Date: MAR 02-05, 2009, Location: Rio de Janeiro, BRAZIL, Patrocinadores: SuB, IEEE TTTC, UFRGS, FIEB SENAI, LSITEI

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DOI: 10.1109/latw.2009.4813817

SCOPUS: 2-s2.0-67649833995

Wos: WOS:000272027600001

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Measuring Clock-Signal Modulation Efficiency for Systems-On-Chip in Electromagnetic Interference Environment

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Measuring Clock-Signal Modulation Efficiency for Systems-On-Chip in Electromagnetic Interference Environment

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