Delay-Fault Tolerance to Power Supply Voltage Disturbances Analysis in Nanometer Technologies

AuthID
 P-003-SJ6
7
Author(s)
Rodriguez Andina, J
·
3
Editor(es)
Chatterjee, A; Nicolaidis, M; Santos, M
Tipo de Documento
Proceedings Paper
Year published
2009
Publicado
in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM in IEEE International On-Line Testing Symposium, ISSN: 1942-9398
Páginas: 223-228 (6)
Conference
15Th Ieee International On-Line Testing Symposium, Date: JUN 24-26, 2009, Location: Sesimbra, PORTUGAL, Patrocinadores: IEEE
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Publication Identifiers
SCOPUS: 2-s2.0-70449416225
Wos: WOS:000272962700046
Source Identifiers
ISSN: 1942-9398
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