Comparing Macroscopic and Microscopic Properties of Seeded Ferroelectric Thin Films

AuthID
 P-003-TJ4
5
Author(s)
Tipo de Documento
Article
Year published
2008
Publicado
in JOURNAL OF ELECTROCERAMICS, ISSN: 1385-3449
Volume: 21, Número: 1-4, Páginas: 193-197 (5)
Conference
4Th Asian Meeting on Electroceramics (Amec-4), Date: JUN 27-30, 2005, Location: Hangzhou, PEOPLES R CHINA
Indexing
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Scopus®
Crossref®3
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-67651092380
Wos: WOS:000262833200039
Source Identifiers
ISSN: 1385-3449
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