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Tem and Sem In-Situ Annealing of Nanocrystalline Copper Thin Films
AuthID
P-003-WPP
6
Author(s)
Simoes, S
·
Calinas, R
·
Ferreira, PJ
·
Viana, F
·
Vieira, MT
·
Vieira, MF
Document Type
Editorial Material
Year published
2008
Published
in
MICROSCOPY AND MICROANALYSIS,
ISSN: 1431-9276
Volume: 14, Issue: SUPPL. 3, Pages: 49-52 (4)
Indexing
Wos
®
Scopus
®
Crossref
®
4
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Metadata
Sources
Publication Identifiers
DOI
:
10.1017/s1431927608089368
Scopus
: 2-s2.0-53349097830
Wos
: WOS:000207534900017
Source Identifiers
ISSN
: 1431-9276
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