Morphological and Structural Characterization of Oxidized La-Si Sputtered Thin Films

AuthID
 P-003-WPZ
2
Author(s)
Document Type
Editorial Material
Year published
2008
Published
in MICROSCOPY AND MICROANALYSIS, ISSN: 1431-9276
Volume: 14, Issue: SUPPL. 3, Pages: 81-84 (4)
Indexing
Wos®
Scopus®
Crossref®3
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-53349175622
Wos: WOS:000207534900026
Source Identifiers
ISSN: 1431-9276
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas instituições

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service