Nanostructure Characterization in Single and Multi Layer Yttria Stabilized Zirconia Films Using Xps, Sem, Eds and Afm

AuthID
 P-018-MZF
4
Author(s)
Espitia-Cabrera I.
·
Orozco-Hernández H.D.
·
Contreras-García M.E.
Tipo de Documento
Article
Year published
2008
Publicado
in Surface and Coatings Technology, ISSN: 02578972
Volume: 203, Número: 3-4, Páginas: 211-216 (5)
Indexing
Scopus®
Crossref®17
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-55049142058
Source Identifiers
ISSN: 02578972
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