Unravelling the Free Electron Behavior in Inn

AuthID
 P-004-2V8
12
Author(s)
Hofmann, T
·
Schubert, M
·
Xie, MY
·
Persson, POA
·
Monemar, B
·
Hsiao, CL
·
Chen, LC
·
Nanishi, Y
Tipo de Documento
Proceedings Paper
Year published
2008
Publicado
in COMMAD: 2008 CONFERENCE ON OPTOELECTRONIC AND MICROELECTRONIC MATERIALS & DEVICES, ISSN: 1097-2137
Páginas: 90-97 (8)
Conference
Conference on Optoelectronic and Microelectronic Materials and Devices, Date: JUL 28-SEP 01, 2008, Location: Sydney, AUSTRALIA
Indexing
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Publication Identifiers
SCOPUS: 2-s2.0-64849117174
Wos: WOS:000269314800023
Source Identifiers
ISSN: 1097-2137
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