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Standard Histogram Test Precision of Adc Gain and Offset Error Estimation
AuthID
P-004-758
2
Author(s)
Alegria, FC
·
Serra, AC
Document Type
Article
Year published
2007
Published
in
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
ISSN: 0018-9456
Volume: 56, Issue: 5, Pages: 1527-1531 (5)
Conference
22Nd Ieee Instrumentation and Measurement Technology Conference,
Date:
MAY 17-19, 2005,
Location:
Ottawa, CANADA,
Sponsors:
IEEE Instrumentat & Measurement Soc
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Publication Identifiers
DOI
:
10.1109/tim.2007.907978
Scopus
: 2-s2.0-34648836347
Wos
: WOS:000249619700003
Source Identifiers
ISSN
: 0018-9456
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