Bispectral Analysis for Subsurface Defect Detection Using a Differential-Excitation Pect Probe

AuthID
 P-01A-KXV
6
Author(s)
Xie, L
·
Baskaran, P
·
Feng, B
·
Tipo de Documento
Article
Year published
2025
Publicado
in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456
Volume: 74, Páginas: 1-9 (9)
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Publication Identifiers
SCOPUS: 2-s2.0-105022742961
Wos: WOS:001631899000009
Source Identifiers
ISSN: 0018-9456
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