in JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, ISSN: 0957-4522
Volume: 18, Número: 7, Páginas: 769-773 (5)
Conference
2Nd International Workshop on Coordination Action on Defects Relevant to Engineering Silicon-Based Devices, Date: SEP 08-11, 2006, Location: Kalives, GREECE
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CORE Conference
No information about CORE Rank
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Journal Factors
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