X-Ray Diffraction and Raman Study of Nanogranular Batio3-Cofe2O4 Thin Films Deposited by Laser Ablation on Si/Pt Substrates

AuthID
P-004-9XN
Tipo de Documento
Article
Year published
2007
Publicado
in PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, ISSN: 0031-8965
Volume: 204, Número: 6, Páginas: 1731-1737 (7)
Conference
7Th International Conference on Trends in Nanotechnology (Tnt 2006), Date: SEP 04-08, 2006, Location: Grenoble, FRANCE
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-34547227295
Wos: WOS:000247542500019
Source Identifiers
ISSN: 0031-8965
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