Analysis of the Ztc Bias Points in the Finfet Gate Capacitance and Transition Frequency

AuthID
 P-01B-7M1
9
Author(s)
Coelho, M
·
Toledo, P
·
Matos, A
·
Martins, R
·
Ferreira, R
·
Subrahmanyam, B
·
Augusto, JS
·
Oliveira, JP
Tipo de Documento
Proceedings Paper
Year published
2025
Publicado
in 2025 37th International Conference on Microelectronics (ICM)
Páginas: 1-6
Indexing
Crossref®
Google Scholar®
Publication Identifiers
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2026 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service