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Positron Annihilation and Constant Photocurrent Method Measurements on A-Si : H Films: A Comparative Approach to Defect Identification

AuthID
P-004-C5G

Author(s)

Gordo, PM

de Lima, AP

Tipo de Documento

Article

Year published

2007

Publicado

in RADIATION PHYSICS AND CHEMISTRY, ISSN: 0969-806X

Volume: 76, Número: 2, Páginas: 220-223 (4)

Conference

8Th International Workshop on Positron and Positronium Chemistry (Ppc-8), Date: SEP 04-09, 2005, Location: Coimbra, PORTUGAL

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Publication Identifiers

DOI: 10.1016/j.radphyschem.2006.03.040

SCOPUS: 2-s2.0-33751195513

Wos: WOS:000242919200034

Source Identifiers

ISSN: 0969-806X

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Positron Annihilation and Constant Photocurrent Method Measurements on A-Si : H Films: A Comparative Approach to Defect Identification

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Positron Annihilation and Constant Photocurrent Method Measurements on A-Si : H Films: A Comparative Approach to Defect Identification

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