An Experimental Comparison of Substrate Noise Generated by Cmos and by Low-Noise Digital Circuits

AuthID
 P-000-E1C
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2004
Publicado
in 2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 2, PROCEEDINGS, ISSN: 0271-4310
Volume: 2, Páginas: 481-484 (4)
Conference
Ieee International Symposium on Circuits and Systems, Date: MAY 23-26, 2004, Location: Vancouver, CANADA, Patrocinadores: IEEE, Circuits & Syst Soc
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-4344569783
Wos: WOS:000223124000121
Source Identifiers
ISSN: 0271-4310
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