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Development of a Yarn Evenness Measurement and Hairiness Analysis System
AuthID
P-004-PWM
5
Author(s)
Carvalho, V
·
Cardoso, P
·
Belsley, M
·
Vasconcelos, RM
·
Soares, FO
Document Type
Proceedings Paper
Year published
2006
Published
in
IECON 2006 - 32ND ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS, VOLS 1-11
in
IEEE Industrial Electronics Society,
ISSN: 1553-572X
Pages: 971-976 (6)
Conference
32Nd Annual Conference of the Ieee-Industrial-Electronics-Society,
Date:
NOV 07-10, 2006,
Location:
Paris, FRANCE,
Sponsors:
IEEE Ind Elect Soc
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Publication Identifiers
DOI
:
10.1109/iecon.2006.347502
Wos
: WOS:000245905001082
Source Identifiers
ISSN
: 1553-572X
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