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Improved Elm Scaling with Impurity Seeding in Jet
AuthID
P-000-FEW
P-000-FEW
12
Author(s)
Budny, RV
·Dumortier, P
·Jachmich, S
·Loarte, A
·Monier-Garbet, P
·Ongena, J
·Rapp, J
·
1
Group Author(s)
JET EFDA contributors
Tipo de Documento
Article
Year published
2003
Publicado
in PLASMA PHYSICS AND CONTROLLED FUSION, ISSN: 0741-3335
Volume: 45, Número: 9, Páginas: 1657-1669 (13)
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ISSN: 0741-3335
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