Measurement of the Dopant Concentration in a Semiconductor Using the Seebeck Effect

AuthID
 P-005-1CY
6
Author(s)
Po, JM
·
Vallera, AM
Tipo de Documento
Article
Year published
2013
Publicado
in MEASUREMENT SCIENCE & TECHNOLOGY, ISSN: 0957-0233
Volume: 24, Número: 5
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Publication Identifiers
SCOPUS: 2-s2.0-84876764838
Wos: WOS:000317585600032
Source Identifiers
ISSN: 0957-0233
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