The Influence of in Situ Photoexcitation on a Defect Structure Generation in Ar+ Implanted Gaas(001) Crystals Revealed by High-Resolution X-Ray Diffraction and Rutherford Backscattering Spectroscopy

AuthID
 P-000-GM5
7
Author(s)
Chtcherbatchev, KD
·
Bublik, VT
·
Markevich, AS
·
Tipo de Documento
Article
Year published
2003
Publicado
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 36, Número: 10A, Páginas: A143-A147 (5)
Conference
X-Top 2002 Conference, Date: 2002, Location: GRENOBLE, FRANCE
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0038621871
Wos: WOS:000183446300030
Source Identifiers
ISSN: 0022-3727
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Citações
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

CORE Conference
No information about CORE Rank

During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.

TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.

Journal Factors
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

Full Text
Full Text @ sfx.b-on.pt

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2026 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service