Spectroscopic Ellipsometry Study of Amorphous Silicon Anodically Oxidised

AuthID
 P-000-HE1
6
Author(s)
Goncalves, A
·
1
Editor(es)
Roca i Cabarrocas PFortunato GRobertson JStutzmann M
Tipo de Documento
Article
Year published
2003
Publicado
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 427, Número: 1-2, Páginas: 345-349 (5)
Conference
4Th Symposium on Thin Films for Large Area Electronics Held at the Emrs 2002 Spring Conference, Date: JUN 18-21, 2002, Location: STRASBOURG, FRANCE, Patrocinadores: European Mat Res Soc
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Publication Identifiers
SCOPUS: 2-s2.0-0037416725
Wos: WOS:000182573200067
Source Identifiers
ISSN: 0040-6090
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