Low-Cost Power Quality Monitor Based on a Pc

AuthID
 P-000-KTR
3
Author(s)
Batista, J
·
Martins, JS
Document Type
Proceedings Paper
Year published
2003
Published
in 2003 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1 AND 2
Pages: 323-328 (6)
Conference
Ieee International Symposium on Industrial Electronics, Date: JUN 09-11, 2003, Location: RIO DE JANEIRO, BRAZIL, Sponsors: IEEE, ies, SICE, Coppe UFRJ
Indexing
Wos®
Publication Identifiers
Wos: WOS:000188940100026
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas instituições

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service