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Ab Initio Calculations and Measurements of Thermoelectric Properties of V2O5 Films
AuthID
P-006-9M9
8
Author(s)
Chumakov, Y
·
Xiong, SY
·
Santos, JR
·
Ferreira, I
·
Termentzidis, K
·
Pokropivny, A
·
Cortona, P
·
Volz, S
Document Type
Article
Year published
2013
Published
in
JOURNAL OF ELECTRONIC MATERIALS,
ISSN: 0361-5235
Volume: 42, Issue: 7, Pages: 1597-1603 (7)
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Publication Identifiers
DOI
:
10.1007/s11664-012-2329-6
Scopus
: 2-s2.0-84879793759
Wos
: WOS:000320890800052
Source Identifiers
ISSN
: 0361-5235
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