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Rtl Design Validation, Dft and Test Pattern Generation for High Defects Coverage
AuthID
P-000-PVR
4
Author(s)
Santos, MB
·
Goncalves, FM
·
Teixeira, IC
·
Teixeira, JP
Document Type
Article
Year published
2002
Published
in
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
ISSN: 0923-8174
Volume: 18, Issue: 2, Pages: 179-187 (9)
Conference
Ieee European Test Workshop (Etw 01),
Date:
MAY 29-JUN 01, 2001,
Location:
STOCKHOLM, SWEDEN,
Sponsors:
IEEE Comp Soc Test Technol Council, Linkoping Univ, Ericsson, Philips, Mentor Graph
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Metadata
Sources
Publication Identifiers
DOI
:
10.1023/a:1014997610714
Scopus
: 2-s2.0-0036534503
Wos
: WOS:000174987600009
Source Identifiers
ISSN
: 0923-8174
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