Defect-Oriented Testing of Analogue and Mixed Signal Ics

AuthID
P-007-87Q
Document Type
Article
Year published
1998
Published
in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
Volume: 2, Pages: 419-424
Conference
Proceedings of the 1998 5Th Ieee International Conference on Electronics, Circuits and Systems (Icecs'98) - Surfing the Waves of Science and Technology, Date: 7 September 1998 through 10 September 1998, Location: Lisboa, Portugal
Indexing
Publication Identifiers
Scopus: 2-s2.0-0032283790
Export Publication Metadata
Info
At this moment we don't have any links to full text documens.