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Methods for Fast Yield Learning in A Dram Wafer Fab Using a Remote Packaging and Test Site

AuthID
P-007-GMY

Author(s)

Trahan, R

Hill, W

Chapman, R

Bicho, A

Gumaer, N

Gomes, M

Tipo de Documento

Proceedings Paper

Year published

2006

Publicado

in ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, ISSN: 1078-8743

Volume: 2006, Páginas: 222-226

Conference

17Th Annual Semi/Ieee Advanced Semiconductor Manufacturing Conference, Asmc 2006, Date: 22 May 2006 through 24 May 2006, Location: Boston, MA, Patrocinadores: SEMI;IEEE Electron Devices Society, EDS;IEEE Components, Packaging, and Manufact. Technol., CPMT;Soc.Applied Materials, Inc.

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