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Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes

AuthID
P-007-HDX

Author(s)

Rodriguez Irago, M

Document Type

Proceedings Paper

Year published

2006

Published

in Proceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposium

Volume: 2006, Pages: 257-262

Conference

Iolts 2006: 12Th Ieee International On-Line Testing Symposium, Date: 10 July 2006 through 12 July 2006, Location: Como, Sponsors: IEEE Computer Society, Test Technology Technical Council

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Publication Identifiers

DOI: 10.1109/iolts.2006.25

Scopus: 2-s2.0-34247221599

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