Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes

AuthID
 P-007-HDX
6
Author(s)
Rodriguez Irago, M
·
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in Proceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposium
Volume: 2006, Páginas: 257-262
Conference
Iolts 2006: 12Th Ieee International On-Line Testing Symposium, Date: 10 July 2006 through 12 July 2006, Location: Como, Patrocinadores: IEEE Computer Society, Test Technology Technical Council
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SCOPUS: 2-s2.0-34247221599
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